COMPANY
Greeting
Overview
History
Direction
BUSINESS
E-beam lithography
Optical test equipment
Automation equipment
R&D
Micro/Nano pattern research
Roll imprint process research
Equipment holding
BOARD
Reference Room
NEWS
Notice
HOME
COMPANY
Greeting
Overview
History
Direction
BUSINESS
E-beam lithography
Optical test equipment
Automation equipment
R&D
Micro/Nano pattern research
Roll imprint process research
Equipment holding
BOARD
Reference Room
NEWS
Notice
ALTEC
FOR A BETTER TECHNOLOGY
We will grow to become a trusted partner by supplying the highest-quality products.
Micro / Nano pattern research
Roll imprint process research
Equipment holding
Equipment holding
Micro / Nano pattern research
Roll imprint process research
Equipment holding
Equipment holding
Home > R&D > Equipment holding
Research equipment
Measuring equipment
Cylinder surface measurement equipment
Maximum acceleration voltage 30KeV
PXI system-based nano-level cylinder surface measurement and exposure combined use
X-axis and rotary axis stages Mechanical control?
SEM interlock
Cylinder mold roundness meter
Specification: Centering range: ±3mm, Leveling adjustment range: ±1 °
Usage: cylinder shape measurement (outside / inside)
Rotation speed: 10 rpm
Vertical moving speed: 50mm / s
Measurement SIZE: Diameter 300mm
High Frequency Waveform Analyzer
Specification: 500MHz, 4Ch
Usage: Signal measurement
High Resolution Oscilloscope
Laser displacement sensor
Measuring distance: 50 ~ 450mm
Resolution: 0.01mm
Measurement time: 2ms
Real-time distance value display